FIELD EMISSION: A TOOL FOR STUDYING SEMICONDUCTOR SURFACES
- 1 January 1963
- journal article
- Published by Wiley in Annals of the New York Academy of Sciences
- Vol. 101 (3), 850-856
- https://doi.org/10.1111/j.1749-6632.1963.tb54941.x
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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- Äußere Feldemission von ZnS‐EinkristallenAnnalen der Physik, 1959
- Application of the Ion Bombardment Cleaning Method to Titanium, Germanium, Silicon, and Nickel as Determined by Low-Energy Electron DiffractionJournal of Applied Physics, 1958
- Pressures, Densities, and Temperatures in the Upper AtmospherePhysical Review B, 1952
- Elektronenmikroskopische Beobachtungen von FeldkathodenThe European Physical Journal A, 1937