A Study of Layer Adhesion by Acoustic Microscopy
- 1 January 1987
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Acoustic Micro-MetrologyIEEE Transactions on Sonics and Ultrasonics, 1985
- Nondestructive detection of Rayleigh wave dispersion in berylliumApplied Physics Letters, 1985
- Calculation of the acoustic material signature of a layered solidThe Journal of the Acoustical Society of America, 1985
- Reflection of finite acoustic beams from loaded and stiffened half-spacesThe Journal of the Acoustical Society of America, 1984
- Ultrasonic leaky waves in the presence of a thin layerJournal of Applied Physics, 1981
- Film adhesion studies with the acoustic microscpeThin Solid Films, 1980