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Polystyrene spheres on mica substrates: AFM calibration, tip parameters and scan artefacts
Home
Publications
Polystyrene spheres on mica substrates: AFM calibration, tip parameters and scan artefacts
Polystyrene spheres on mica substrates: AFM calibration, tip parameters and scan artefacts
MC
M. VAN Cleef
M. VAN Cleef
SH
S. A. Holt
S. A. Holt
G. S. Watson
G. S. Watson
SM
S. Myhra
S. Myhra
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1 January 1996
journal article
Published by
Wiley
in
Journal of Microscopy
Vol. 181
(1)
,
2-9
https://doi.org/10.1046/j.1365-2818.1996.74351.x
Abstract
No abstract available
Keywords
FORCE MICROSCOPY
POLYSTYRENE SPHERES
TIP PARAMETERS
SCAN ARTEFACTS
NONCONTACT MODE.
Cited by 31 articles