Phase measurement interferometric microscopy of thin films: Analysis of topography, refractive index, and thickness of solvent swollen polystyrene films
- 20 March 1991
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 198 (1-2), 369-386
- https://doi.org/10.1016/0040-6090(91)90355-2
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- In situ topographical imaging of electrode surfaces using high-resolution phase-measurement interferometric microscopyAnalytical Chemistry, 1990
- Internal energy effects on ion-neutral complexes from unimolecular dissociation of n-propyl phenyl ether radical cationsJournal of the American Chemical Society, 1990
- Scanned-Probe MicroscopesScientific American, 1989
- Surface injection catalysis at glassy carbon electrodesJournal of Electroanalytical Chemistry and Interfacial Electrochemistry, 1989
- Morphology changes due to anodic treatment of glassy carbon electrodesJournal of Electroanalytical Chemistry and Interfacial Electrochemistry, 1989
- Phase Detection Interferometric Microscopy of Electrode Surfaces: Measurement of Localized Dissolution of Iron MicroelectrodesJournal of the Electrochemical Society, 1989
- Scanning tunneling microscopic imaging of electropolymerized, doped polypyrrole: visual evidence of semicrystalline and helical nascent polymer growthThe Journal of Physical Chemistry, 1989
- Microscopic Ellipsometric Observation of the Change in Passive Film on 18Cr‐8Ni Stainless Steel with the Initiation and Growth of PitJournal of the Electrochemical Society, 1985
- Measurement of surface topography of magnetic tapes by Mirau interferometryApplied Optics, 1985
- Analysis of Passive Films on Austeno‐Ferritic Stainless Steel by Microscopic EllipsometryJournal of the Electrochemical Society, 1983