Abstract
The absolute magnetic susceptibility χ of amorphous Ge (aGe) prepared by evaporation, rf sputtering, and glow discharge decomposition of GeH4 and of amorphous Si (aSi) prepared by rf sputtering and glow discharge decomposition of SiH4 was measured in the range of 1.5T300 K. The spin component χS of χ was fit to a Curie-Weiss law χS=C(T+ΘN) for T>10 K with ΘN between 0 and 4 K depending on the sample's state of anneal. Before annealing all samples except glow discharge aGe deviate from Curie-Weiss behavior below 8 K suggesting antiferromagnetic ordering of most of the spins. As the annealing temperature TA is increased above 50°C, the spin density NS in sputtered and evaporated aGe decreases and the antiferromagnetic ordering temperature TN is reduced to less than 1.5 K for TA200°C. The effect of hydrogen doping of sputtered aGe is to reduce TN below 1.5 K. These results are discussed in terms of several theories of amorphous antiferromagnetism and the present understanding of spins in amorphous tetrahedral semiconductors.