Comparative potential performance of Si, GaAs, GaInAs, InAs submicrometer-gate FET's
- 1 November 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 27 (11), 2158-2160
- https://doi.org/10.1109/T-ED.1980.20166