Smectic-layer growth at solid interfaces
- 30 April 1990
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 64 (18), 2160-2163
- https://doi.org/10.1103/PhysRevLett.64.2160
Abstract
X-ray reflectivity is used to study the temperature-dependent smectic layering of the cyanobiphenyl compounds (nCB) in the isotropic phase at alkylsilane-coated silicon surfaces. Layer-by-layer growth is observed for 11CB and 12CB. Comparison of the layering transition temperatures with measurements at the vapor interface is used to determine the relative anchoring strengths at the two interfaces.Keywords
This publication has 13 references indexed in Scilit:
- LIQUID CRYSTAL SURFACESLe Journal de Physique Colloques, 1989
- Smectic Liquid Crystal Monolayers on Graphite Observed by Scanning Tunneling MicroscopyScience, 1989
- Orientational wetting behavior of a liquid-crystal homologous seriesPhysical Review Letters, 1989
- Layer-by-Layer Surface Freezing of Freely Suspended Liquid-Crystal FilmsPhysical Review Letters, 1989
- X-Ray Scattering Studies of the Melting of Lead SurfacesPhysical Review Letters, 1988
- Density-functional theory of nematic and smectic-Aorder near surfacesPhysical Review A, 1988
- Wetting phenomena of binary liquid mixtures on chemically altered substratesPhysical Review Letters, 1987
- Theory of smectic wetting and layeringPhysical Review A, 1987
- Quantized layer growth at liquid-crystal surfacesPhysical Review Letters, 1986
- Observation of Surface MeltingPhysical Review Letters, 1985