Mid-to-high-precision x-ray measurements
- 1 November 1982
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review A
- Vol. 26 (5), 2696-2706
- https://doi.org/10.1103/physreva.26.2696
Abstract
New x-ray wavelength (energy) and width measurements are reported for a number of elements from . The x rays were produced with the use of an electron Van de Graaff, and the measurements were made with a two-axis flat-crystal transmission spectrometer equipped with angle-measuring interferometers. The new measurements reported here, combined with other high-precision x-ray wavelengths, form a moderately extensive data base for comparison with theoretical calculations. Comparison with recent revisions of a previously available all- calculation reveals improved patterns of general agreement with, however, important exceptions. The newly measured linewidths are in agreement with widths calculated via relativistic wave functions used for the term estimates.
Keywords
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