Multidimensional maximum likelihood failure detection and estimation
- 1 April 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Automatic Control
- Vol. 26 (2), 567-570
- https://doi.org/10.1109/tac.1981.1102638
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Maximum-likelihood estimation of a process with random transitions (failures)IEEE Transactions on Automatic Control, 1979
- Estimation of the state of a nonlinear process in the presence of nongaussian noise and disturbancesJournal of the Franklin Institute, 1966