EXAFS of Cd1−xZnxTe: A test of the random distribution in zincblende ternary alloys
- 28 February 1985
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 53 (6), 509-512
- https://doi.org/10.1016/0038-1098(85)90180-2
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Local structure of ternary semiconducting random solid solutions: Extended x-ray-absorption fine structure ofPhysical Review B, 1984
- Extended x-ray-absorption fine-structure study ofrandom solid solutionsPhysical Review B, 1983
- Structural and electronic properties of Fe and TiFe from extended and near-edge x-ray-absorption structurePhysical Review B, 1983
- Elastic Properties of ZnS Structure SemiconductorsPhysical Review B, 1970
- Solid solution in AIIBvI telluridesJournal of Physics and Chemistry of Solids, 1960