A method of mounting small samples for electron-probe microanalysis
- 1 July 1969
- journal article
- other
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 2 (7), 619-620
- https://doi.org/10.1088/0022-3735/2/7/416
Abstract
A method of mounting samples as small as about 10 μm in diameter for electron-probe microanalysis is described. By permitting mechanical polishing of an exposed surface, the method makes possible a fully quantitative analysis of such particles.Keywords
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