Relationship between electroluminescence and current transport in organic heterojunction light-emitting devices

Abstract

We measure the current–voltage and electroluminescence characteristics of single‐heterojunction, vacuum‐deposited organic light‐emitting devices (OLEDs) over a wide range of materials, temperatures, and currents. We find that the current is limited by a large density of traps with an exponential energy distribution below the lowest unoccupied molecular orbital. The characteristic trap depth is 0.15 eV. Furthermore, in metal–quinolate‐based devices, electroluminescence originates from recombination of Frenkel excitons, and its temperature dependence is consistent with the excitons being formed by Coulombic relaxation of the trapped electrons with holes injected from the counter electrode. By semiempirical molecular orbital modeling, we find that the trap distribution obtained from the current–voltage characteristics is consistent with a distribution in the metal–quinolate molecular conformations which result in a continuous, exponential distribution of allowed states below the lowest unoccupied molecular orbital. We discuss the implications of the intrinsic relationship between electroluminescence and current transport in OLEDs for the optimization of efficiency and operating voltage in these devices.