Hot-carrier population inversion inpGe

Abstract
Hall-effect measurements are performed on pGe crystals in E up to 3 kV/cm and B up to 5 T at 4.2 K employing a new capacitive method for the detection of the Hall field Ey. At high E levels, there appear in the Ey vs B curves new structures which are interpreted in terms of the population inversion of heavy holes and light holes.