Holographic measurements of optically induced refractive index inhomogeneities in bismuth titanate

1 January 1969

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE

Vol. 57 (2), 252-253
https://doi.org/10.1109/PROC.1969.6952

Abstract

Optically induced refractive index inhomogeneities (optical damage) in single crystal bismuth titanate (Bi4Ti3O12) have been observed by the method of forming holograms inside the crystal. The maximum index change induced by light at 4880 Å wavelength is approximately 10^-5and lasts for a few minutes at room temperature.

Keywords

HOLOGRAPHY
HOLOGRAPHIC OPTICAL COMPONENTS
OPTICAL REFRACTION
OPTICAL VARIABLES CONTROL
REFRACTIVE INDEX
BISMUTH
TITANIUM COMPOUNDS
SEMICONDUCTOR DIODES
BREAKDOWN VOLTAGE
GUNN DEVICES

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