An Electron Diffraction Study Evaporated Boron Films
- 1 July 1966
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 5 (7)
- https://doi.org/10.1143/jjap.5.582
Abstract
The structure of evaporated boron films was studied by electron diffraction, using the sector-microphotometer procedure. Eleven halos were observed in the region of s-1. Both the radial distribution and the intensity comparison methods were applied to analysis of the data. Bond distances similar to those appearing in the crystalline forms of boron were found in the evaporated film. The 12B icosahedra which are the structural entities common to the three modifications of crystal boron exist also in the film. The arrangement of the icosahedra is quite random.Keywords
This publication has 9 references indexed in Scilit:
- The Structure of β-Rhombohedral BoronJournal of the American Chemical Society, 1963
- Electron diffraction study of evaporated carbon filmsActa Crystallographica, 1960
- An Analysis of Polymorphism in Boron Based upon X-Ray Diffraction Results1Journal of the American Chemical Society, 1960
- Quantitative treatment of multiple scattering effect in continuous electron diffraction curvesActa Crystallographica, 1959
- The crystal structure of a simple rhombohedral form of boronActa Crystallographica, 1959
- The Structure of Tetragonal Boron1Journal of the American Chemical Society, 1958
- Internal Motion and Molecular Structure Studies by Electron Diffraction. III. Structure of CH2CF2 and CF2CF2The Journal of Chemical Physics, 1950
- Scientific Foundations of Vacuum TechniquePhysics Today, 1949
- Evaporation Technique for Highly Refractory SubstancesReview of Scientific Instruments, 1934