Electron-Beam-Induced crystallization of anodic barrier films on aluminium
- 20 March 1981
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 77 (4), 313-318
- https://doi.org/10.1016/0040-6090(81)90323-0
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- Observation of flaws in anodic films on aluminiumNature, 1980
- The application of ultramicrotomy to the electronoptical examination of surface films on aluminiumCorrosion Science, 1978
- Nucleation and growth of porous anodic films on aluminiumNature, 1978
- A study of barrier film growth on aluminium in solutions of film-promoting and aggressive ions using secondary ion mass spectrometryCorrosion Science, 1976
- Transport Numbers of Metal and Oxygen during the Anodic Oxidation of TantalumJournal of the Electrochemical Society, 1973
- The Migration of Oxygen during the Anodic Oxidation of TantalumJournal of the Electrochemical Society, 1973
- High Field Ionic Conduction in Tantalum Anodic Oxide Films with Incorporated PhosphateJournal of the Electrochemical Society, 1970
- The Migration of Metal and Oxygen during Anodic Film FormationJournal of the Electrochemical Society, 1965
- Structure and crystallization of nearly amorphous beryllium oxide and aluminium oxide filmsActa Crystallographica, 1956
- Structure of Amorphous Aluminium Oxide FilmsNature, 1951