Infrared spectroscopic ellipsometry using a Fourier transform infrared spectrometer: Some applications in thin-film characterization
- 1 October 1989
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (10), 3212-3216
- https://doi.org/10.1063/1.1140554
Abstract
No abstract availableKeywords
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