The use of RF voltage in quartz crystal microbalance measurements: application to nonmetallic films

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Abstract
The applications of the piezoelectrical quartz crystal microbalance are extended by measuring the RF voltage simultaneously with the frequency. The RF voltage decreases linearly with the added mass and is sensitive to a mass change (dU/dm= sigma v) of the same order of magnitude as the frequency. The sensitivity sigma v depends on the mechanical rigidity of the deposited films, i.e. on the interaction forces within the films.