An angle-scanned photoelectron diffraction study on the surface relaxation of ZnO (0001)
- 1 November 1994
- journal article
- Published by Elsevier in Surface Science
- Vol. 319 (1-2), 149-156
- https://doi.org/10.1016/0039-6028(94)90577-0
Abstract
No abstract availableKeywords
This publication has 22 references indexed in Scilit:
- Site requirements of reactions on oxide surfacesJournal of Vacuum Science & Technology A, 1993
- Structure and bonding of tetrahedrally coordinated compound semiconductor cleavage facesJournal of Vacuum Science & Technology A, 1992
- Effects of madelung potentials at surfaces of ZnO on photoemission spectra and work functionsSurface Science, 1982
- Structure parameters and polarity of the wurtzite type compounds Sic—2H and ZnOSolid State Communications, 1979
- Explanation of the 6-fold LEED patterns from polar (0001) and (000
- Atomic geometry of cleavage surfaces of tetrahedrally coordinated compound semiconductorsJournal of Vacuum Science and Technology, 1976
- Atomic geometry of the low-index surfaces of ZnO: LEED analysisJournal of Vacuum Science and Technology, 1976
- The crystallography of the polar (0001) Zn and (0001)O surfaces of zinc oxideSurface Science, 1974
- The wurtzite Z parameter for beryllium oxide and zinc oxideActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1969
- Remeasurement of the structure of hexagonal ZnOActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1969