Saturation of Fe2+ ion concentration in single-crystal YIG(Si)

Abstract

The relative Fe²⁺ ion concentrations in three flux‐grown crystals of YIG(Si), containing up to 0.3 Si⁴⁺ ion per formula unit, have been determined by optical techniques. The Fe²⁺ ion concentration appears to reach a maximum or saturation value at Si⁴⁺ ion content of 0.1 per formula unit. The Si⁴⁺ ions not compensated by Fe²⁺ or Pb²⁺ ions, the sum of which is less than the Si⁴⁺ ion content, must be compensated by cation vacancies.