Defect and structure analysis of n+-, p+- and p-type porous silicon by the electron paramagnetic resonance technique
- 31 December 1993
- journal article
- Published by Elsevier in Journal of Luminescence
- Vol. 57 (1-6), 301-313
- https://doi.org/10.1016/0022-2313(93)90148-g
Abstract
No abstract availableKeywords
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