Pressure-scanning mm-wave dispersion spectrometer
- 1 July 1975
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 46 (7), 817-825
- https://doi.org/10.1063/1.1134345
Abstract
A differential refraction spectrometer for measuring the absolute intensity distribution of microwave spectra in gases by means of dispersion pressure profiles is described. The instrument was applied to study the 60 GHz band spectrum of oxygen under simulated atmospheric conditions (10−3–103 Torr, 252–325 K). The detection sensitivity for dispersion was better than 1 part in 109 using two high‐Q (∼4×105) resonators at 2:1 related frequencies and a sampling phase meter. Illustrative examples of data taken around 61 GHz, their reduction to spectroscopic parameters, and problems related to dynamic limitations are dealt with.Keywords
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