Role of Condensation Phenomena in the Measurement of Film Thickness by the Oscillating Quartz Crystal Method

Abstract

The deposition of thin layers of ZnS and MgF₂ on each other and on a glass surface was studied. The rate of evaporation, the film thickness, and the reflection of the layers were measured simultaneously. Condensation effects were found to influence the formation of layers on different substrates, a fact which has to be taken into account in measurements using the oscillating quartz crystal technique.