Far-infrared laser spectroscopy ofSi
- 1 February 1979
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 19 (3), 1437-1442
- https://doi.org/10.1103/physrevb.19.1437
Abstract
We have measured the ratio of the superconducting to the normal-state transmissions, , in two thin films of Si with a new optically pumped far-infrared laser spectrometer. The laser system gave exceptional signal-to-noise ratios with room-temperature detectors. The data could not be well fitted with the usual Mattis-Bardeen result but could be explained by the Leplae formulation which includes the effects of a finite scattering time. Our analysis gave a value for the better of the two films ( K) in good agreement with tunneling determinations and with fewer possibilities for surface problems. We observed features below the gap energy in both samples whose origin is not understood.
Keywords
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