Irreversible changes in the electrical conductivity of freshly-evaporated silicon oxide after atmospheric exposure
- 1 December 1970
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 3 (12), L75-L77
- https://doi.org/10.1088/0022-3727/3/12/102
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The conduction process in silicon oxideThin Solid Films, 1970
- Properties of pulse-deposited thin-film silicon monoxide capacitorsThin Solid Films, 1969
- Conduction processes in vacuum-deposited films of silicon oxideJournal of Materials Science, 1969
- Dielectric Properties of Films Formed by Vacuum Evaporation of Silicon MonoxideJournal of Applied Physics, 1967