Electron intensity measurement in a scanning diffraction camera
- 1 September 1981
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 52 (9), 1321-1324
- https://doi.org/10.1063/1.1136791
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Review: Scanning high-energy electron diffraction (SHEED) in materials scienceJournal of Materials Science, 1972
- On scanning electron diffraction. II†International Journal of Electronics, 1968