AnomalousWhite-Line Ratios in theTransition Metals
- 4 August 1980
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 45 (5), 397-401
- https://doi.org/10.1103/physrevlett.45.397
Abstract
The near-edge fine structure has been investigated in electron-energy-loss spectra from thin films of transition metals and an unexpected departure from the statistical "white-line" intensity ratio of 2: 1 is reported. For Ti, a ratio of 0.7: 1 is observed, while for Fe and Ni the ratio exceeds 3: 1, indicating a systematic trend within the period. It is suggested that many-electron effects may be important.
Keywords
This publication has 11 references indexed in Scilit:
- One-electron and many-body effects in x-ray absorption and emission edges of Li, Na, Mg, and Al metalsPhysical Review B, 1979
- X-ray absorption fine structure above the TiedgePhysical Review B, 1979
- 3p excitations of atomic and metallic Fe, Co, Ni and CuJournal of Physics B: Atomic and Molecular Physics, 1979
- Resonance absorption at theedges of tantalum: The white linePhysical Review B, 1979
- Augmented-plane-wave calculation and measurements ofandx-ray spectra for solid NiPhysical Review B, 1978
- White lines in x-ray absorptionPhysical Review B, 1977
- Multiplet splitting of the manganeseandlevels in Mnsingle crystalsPhysical Review B, 1975
- A Wien Filter for Use as an Energy Analyzer with an Electron MicroscopeReview of Scientific Instruments, 1971
- Molecular-Orbital Interpretation of the Soft X-Ray LII,III Emission and Absorption Spectra from Some Titanium and Vanadium CompoundsJournal of Applied Physics, 1970
- Contribution à l’étude des métaux de transition du premier groupe, du cuivre et de leurs oxydes par spectroscopie X dans le domaine de 13 à 22 ÅAnnales de Physique, 1966