Electron microscopic study of the surfaces of wires used in field ionization mass spectrometry
- 31 October 1969
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 3 (3-4), 277-284
- https://doi.org/10.1016/0020-7381(69)85011-4
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Experimental investigation of the use of sharp edges for the production of positive ions in field-ionization mass spectrometryInternational Journal of Mass Spectrometry and Ion Physics, 1968
- Elemental composition determination by field-ion mass spectrometryAnalytical Chemistry, 1968
- Simplified mass spectra by dual field ionization-electron impact sourceAnalytical Chemistry, 1967