Quantitativity in III–V compounds by low-energy ion scattering spectrometry (ISS)
- 2 May 1980
- journal article
- Published by Elsevier in Surface Science
- Vol. 95 (2-3), 511-526
- https://doi.org/10.1016/0039-6028(80)90193-4
Abstract
No abstract availableThis publication has 31 references indexed in Scilit:
- Low-energy ion scattering (LEIS) for composition and structure analysis of the outer surfaceNuclear Instruments and Methods, 1978
- Multiple ion scatteringSurface Science, 1977
- Neutralization and ionization of low energy helium ions scattering from a copper surfaceRadiation Effects, 1977
- Low energy ion scattering: Elastic and inelastic effectsNuclear Instruments and Methods, 1976
- Energy dependence of scattered ion yields in ISSJournal of Vacuum Science and Technology, 1976
- Selected topics in low-energy ion scattering: Surface segregation in Cu/Ni alloys and ion neutralizationSurface Science, 1975
- Double scattering of ions from polycrystalline materialsSurface Science, 1975
- Energy spectra of 6–32 keV neutral and ionized Ar and He scattered from Au targets; ionized fractions as functions of energySurface Science, 1975
- Quantitative aspects of Ion Scattering Spectroscopy (ISS)Surface Science, 1975
- Analysis of surface composition with low-energy backscattered ionsSurface Science, 1971