Rietveld analysis of intensity data taken on the TOF neutron powder diffractometer VEGA
- 1 June 1997
- journal article
- Published by Elsevier in Physica B: Condensed Matter
- Vol. 234-236, 1093-1095
- https://doi.org/10.1016/s0921-4526(97)00032-x
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A new TOF neutron powder diffractometer with arrays of one-dimensional PSD'sPhysica B: Condensed Matter, 1995
- Rietveld analysis of powder patterns obtained by TOF neutron diffraction using cold neutron sourcesJournal of Applied Crystallography, 1987
- The lineshapes in pulsed neutron powder diffractionNuclear Instruments and Methods, 1980