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Novel Characterization Of Thin Film Multilayered Structures: Microcleavage Transmission Electron Microscopy
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Publications
Novel Characterization Of Thin Film Multilayered Structures: Microcleavage Transmission Electron Microscopy
Novel Characterization Of Thin Film Multilayered Structures: Microcleavage Transmission Electron Microscopy
YL
Yves Lepetre
Yves Lepetre
IS
Ivan K. Schuller
Ivan K. Schuller
GR
George Rasigni
George Rasigni
RR
Rene Rivoira
Rene Rivoira
RP
Roger Philip
Roger Philip
PD
Pierre Dhez
Pierre Dhez
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6 August 1985
proceedings article
Published by
SPIE-Intl Soc Optical Eng
https://doi.org/10.1117/12.949675
Abstract
No abstract available
Keywords
TRANSMISSION ELECTRON MICROSCOPY
THIN FILM
THIN FILMS
ELECTRON MICROSCOPY
Cited by 15 articles