The accuracy of four-probe resistivity measurements on silicon
- 1 May 1962
- journal article
- Published by IOP Publishing in British Journal of Applied Physics
- Vol. 13 (5), 231-234
- https://doi.org/10.1088/0508-3443/13/5/311
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- On the influence of shape and variations in conductivity of the sample on four-point measurementsApplied Scientific Research, Section B, 1960
- Improved Automatic Four-Point Resistivity ProbeReview of Scientific Instruments, 1959
- Measurement of Sheet Resistivities with the Four-Point ProbeBell System Technical Journal, 1958
- A four-point probe apparatus for measuring resistivityJournal of Scientific Instruments, 1956