A statistical method to detect ordering and phase separation by APFIM
- 1 June 1998
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 73 (1-4), 279-285
- https://doi.org/10.1016/s0304-3991(97)00168-x
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Statistical analysis of atom probe dataPublished by Oxford University Press (OUP) ,1996
- Metallurgical applicationsPublished by Oxford University Press (OUP) ,1996
- Atom Probe Field Ion MicroscopyPublished by Oxford University Press (OUP) ,1996
- Improvement of the detection efficiency of channel plate electron multiplier for atom probe applicationApplied Surface Science, 1996
- Study of proper conditions for quantitative atom-probe analysisApplied Surface Science, 1994
- On the performance of a microchannel plate detector used for atom-probe analysisApplied Surface Science, 1993
- Towards quantitative analysis of YBa2Cu3O6+δ high-Tc superconductor by APFIMApplied Surface Science, 1993
- Estimation of composition amplitude: Pa and LBM versus VSurface Science, 1992
- Effect of ordering on susceptibility to hydrogen embrittlement of a Ni-base superalloyMetallurgical Transactions A, 1992
- Thermodynamics of oxygen ordering inPhysical Review Letters, 1988