Materials testing by Dynamic mechanical analysis
- 1 June 1978
- journal article
- research article
- Published by Springer Nature in Journal of Thermal Analysis and Calorimetry
- Vol. 13 (3), 439-453
- https://doi.org/10.1007/bf01912384
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Amorphous-Semiconductor DevicesScientific American, 1977
- Gamma relaxation in epoxy resins and related polymersPolymer, 1970