Efficiency of Ge and Si(Li) detectors at very low energies by an X-ray doublet method
- 1 November 1978
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 11 (11), 1141-1144
- https://doi.org/10.1088/0022-3735/11/11/016
Abstract
A method for an accurate determination of the efficiency curve of planar solid state detectors at very low photon energies is described. It is based on the measurement of the intensity ratio of doublets of characteristic X-ray lines emitted by suitable chemical compounds irradiated by 55Fe and 241Am radioactive sources.Keywords
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