Diffuse scattering of hard x rays from rough surfaces
- 15 September 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 46 (12), 7953-7956
- https://doi.org/10.1103/physrevb.46.7953
Abstract
The diffuse scattering of hard x rays from rough solid surfaces has been measured and described quantitatively in terms of an improved distorted-wave Born approximation. The rough surface is characterized by the rms roughness σ, the height-height correlation length ξ, and the roughness exponent h. The value for σ is in excellent agreement with that deduced from reflectivity. The significance of the parameters σ, ξ, and h is tested by comparison with the results obtained from scanning force mircoscopy.Keywords
This publication has 8 references indexed in Scilit:
- Determination of the dispersive correction f'(E) to the atomic form factor from X-ray reflectionActa Crystallographica Section A Foundations of Crystallography, 1992
- Neutron scattering by rough surfaces at grazing incidencePhysical Review B, 1992
- Photodiodes as detectors with high dynamical range for X-ray reflectivity measurementsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1991
- X-ray and neutron scattering from rough surfacesPhysical Review B, 1988
- FractalsPublished by Springer Nature ,1988
- Surface Roughness of Water Measured by X-Ray ReflectivityPhysical Review Letters, 1985
- Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicatesRevue de Physique Appliquée, 1980
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954