Scanning tunneling optical microscopy
- 1 May 1989
- journal article
- Published by Elsevier in Optics Communications
- Vol. 71 (1-2), 23-28
- https://doi.org/10.1016/0030-4018(89)90297-6
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Near-field diffraction by a slit: implications for superresolution microscopyApplied Optics, 1986
- Near-field optical-scanning microscopyJournal of Applied Physics, 1986
- Optical characteristics of 0.1 μm circular apertures in a metal film as light sources for scanning ultramicroscopyJournal of Vacuum Science & Technology B, 1985
- Optical stethoscopy: Image recording with resolution λ/20Applied Physics Letters, 1984
- Microscopy and pattern generation with scanned evanescent wavesApplied Optics, 1984
- Quantization of evanescent electromagnetic waves: Momentum of the electromagnetic field very close to a dielectric mediumPhysical Review A, 1980
- La r flexion totale comme filtre d' tats de polarisationNouvelle Revue d'Optique Appliquée, 1972