Learning a Similarity Metric Discriminatively, with Application to Face Verification
Top Cited Papers
- 27 July 2005
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. 1, 539-546
- https://doi.org/10.1109/cvpr.2005.202
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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