CONSIDERATIONS ON A LASER-SCANNING-MICROSCOPE WITH HIGH-RESOLUTION AND DEPTH OF FIELD

Abstract

In conventional light microscopy, the depth of focus is severely limited. This limitation may be overcome by a light optical scanning procedure. The specimen surface is scanned point for point by a focused laser beam. The image of the specimen surface is generated by an electronic system, similar to the procedure used in the scanning electron microscope (SEM). Possibilities to develop a laser-scanning microscope based on available techniques (laser microirradiation, miniprocessors, light detecting systems, automatic focusing, holographic focusing, etc.) are discussed. Because of its ability to form images of high resolution and depth of focus, a laser-scanning microscope may become a valuable tool in addition to conventional light microscopy and scanning electron microscopy.