Uniaxial stress component in diamond anvil high-pressure x-ray cameras
- 1 December 1977
- journal article
- letter
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 48 (12), 5338-5340
- https://doi.org/10.1063/1.323568
Abstract
The effect of the uniaxial stress component on the lattice strains measured with a diamond anvil x‐ray apparatus has been discussed. The results are compared with those published earlier for the tungsten carbide anvil apparatus.Keywords
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