Improvement of Sensitivity of Electron Energy Loss Spectroscopy
- 1 March 1983
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 22 (3A), L173-175
- https://doi.org/10.1143/jjap.22.l173
Abstract
A new method has been developed to drastically increase the sensitivity of the low-energy electron energy loss spectroscopy. This method uses a pulse counting technique to detect a small number of analysed electrons and a difference formula to obtain the second-derivative spectrum. A personal-computer-controlled system has been developed for this purpose and the usefulness of the present method is demonstrated.Keywords
This publication has 1 reference indexed in Scilit:
- Surface-State Transitions of Silicon in Electron Energy-Loss SpectraPhysical Review Letters, 1973