Variation in polarized light intensity with grain-orientation in anodized aluminum
- 31 August 1986
- journal article
- Published by Elsevier in Metallography
- Vol. 19 (3), 345-357
- https://doi.org/10.1016/0026-0800(86)90022-4
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Double-refraction theory applied to anodic films on aluminumMetallography, 1986
- Electron microscopy of ion beam thinned porous anodic films formed on aluminiumCorrosion Science, 1978
- Grain boundary migration motivated by substructure in high purity metal crystalsActa Metallurgica, 1958