An x-ray spectral measurement system for nanosecond plasmas
- 1 February 1974
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 45 (2), 191-194
- https://doi.org/10.1063/1.1686585
Abstract
A 15‐channel Ross filter/silicon diode detection system has been developed for measuring nanosecond pulsed x‐ray spectra in the energy range from 4.5 to 116 keV. The theory and practical aspects of Ross filters and silicon diode detectors are discussed as applied to this system. The data read‐out system consists of a current integrator array, a simultaneous multichannel digital voltmeter, and oscilloscopes. The system is designed for compatibility with a small computer to allow real time spectral measurements. The x‐ray spectrum of a 24 kJ dense plasma focus has been obtained with this system and a theoretical thick target electron beam x‐ray spectrum fit to the experimental data. The best fit is obtained with an E−2 power law electron beam spectrum extending from 5 to 125 keV.Keywords
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