In situ energy-dispersive X-ray reflectivity measurements of structural changes in thin films for organic electroluminescent devices
- 1 December 1997
- journal article
- Published by Elsevier in Synthetic Metals
- Vol. 91 (1-3), 155-158
- https://doi.org/10.1016/s0379-6779(98)80078-7
Abstract
No abstract availableKeywords
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