The detection of thin embedded layers using normal incidence ultrasound
- 1 November 1994
- journal article
- Published by Elsevier in Ultrasonics
- Vol. 32 (6), 431-440
- https://doi.org/10.1016/0041-624x(94)90062-0
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Ultrasonic nondestructive evaluation of thin (sub-wavelength) coatingsThe Journal of the Acoustical Society of America, 1993
- Time-Domain Ultrasonic NDE of the Wave Velocity of a Sub-Half-Wavelength Elastic LayerJournal of Testing and Evaluation, 1993
- Lamb wave interaction with lap-shear adhesive joints: Theory and experimentThe Journal of the Acoustical Society of America, 1991
- Evaluation of interfacial properties in adhesive joints of aluminum alloys using angle-beam ultrasonic spectroscopyJournal of Adhesion Science and Technology, 1991
- An ultrasonic interface layer model for bond evaluationJournal of Adhesion Science and Technology, 1991
- A new technique for ultrasonic-nondestructive evaluation of thin specimensExperimental Mechanics, 1988
- Ultrasonic oblique incidence for improved sensitivity in interface weakness determinationNDT International, 1988
- Study of adhesive bonds using low-frequency obliquely incident ultrasonic wavesThe Journal of the Acoustical Society of America, 1986
- An ultrasonic interface-wave method for predicting the strength of adhesive bondsJournal of Applied Physics, 1981
- Adhesive bondline interrogation using Stoneley wave methodsJournal of Applied Physics, 1979