Conduction properties and microstructure of metal/SiO cermet thin films produced by recoil atom implantation
- 1 May 1972
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 7 (4), 349-364
- https://doi.org/10.1016/0022-3093(72)90270-0
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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