New model of the bond diffractometer for precise determination of lattice parameters and thermal expansion of single crystals
- 1 January 1978
- journal article
- research article
- Published by Wiley in Crystal Research and Technology
- Vol. 13 (5), 561-567
- https://doi.org/10.1002/crat.19780130516
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Specimen and beam tilt errors in Bond's method of lattice parameter determinationActa Crystallographica Section A, 1968
- Fully Automated High-Precision X-Ray DiffractionPublished by Springer Nature ,1968
- A survey of precision lattice parameter measurements as a tool for the characterization of single-crystal materialsMaterials Research Bulletin, 1967
- X-Ray WavelengthsReviews of Modern Physics, 1967
- Precision lattice constant determinationActa Crystallographica, 1960