Coverage of Si substrates by self-assembling monolayers and multilayers as measured by IR, wettability and X-ray diffraction
- 1 October 1985
- journal article
- Published by Elsevier BV in Thin Solid Films
- Vol. 132 (1-4), 153-162
- https://doi.org/10.1016/0040-6090(85)90466-3
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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