Critical implantation temperature and annealing of indium phosphide

Abstract
This communication adds further data to the discussion of implantation temperatures for III–V compounds recently published by Gamo et al. Amorphization of InP by ion implantation can be avoided by heating the target to 150° C. Postimplantation annealing of amorphous layers can be done within 30 min at 500° C under phosphorus pressure but noticeable residual damage is left.