New Approach for Measuring Lateral Diffusion in Langmuir Monolayers by Scanning Electrochemical Microscopy (SECM): Theory and Application
- 20 October 2001
- journal article
- research article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry B
- Vol. 105 (45), 11120-11130
- https://doi.org/10.1021/jp004592j
Abstract
No abstract availableKeywords
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